DocumentCode
1998354
Title
A novel technique to reduce the metastability of Bang-Bang Phase Frequency Detectors
Author
Javidan, M. ; Zianbetov, E. ; Anceau, F. ; Galayko, D. ; Colinet, E. ; Juillard, J.
Author_Institution
LIP6 Lab., Paris VI Univ., Paris, France
fYear
2011
fDate
15-18 May 2011
Firstpage
2577
Lastpage
2580
Abstract
This paper presents a new architecture of bang- bang phase frequency detector based on standard cells. The pro- posed architecture presents advantages in terms of compatibility with fully-automated design flow of digital circuitry compared with other architectures. The metastability failure is also studied. The reliability of this architecture is approved by simulation results in CMOS65 nm.
Keywords
CMOS integrated circuits; circuit stability; failure analysis; phase detectors; CMOS process; bang-bang phase frequency detectors; metastability failure; metastability reduction; size 65 nm; Clocks; Detectors; Integrated circuit modeling; Inverters; Phase locked loops; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location
Rio de Janeiro
ISSN
0271-4302
Print_ISBN
978-1-4244-9473-6
Electronic_ISBN
0271-4302
Type
conf
DOI
10.1109/ISCAS.2011.5938131
Filename
5938131
Link To Document