Title :
An on-chip metastability measurement circuit to characterize synchronization behavior in 65nm
Author :
Beer, Salomon ; Ginosar, Ran ; Priel, Michael ; Dobkin, Rostislav ; Kolodny, Avinoam
Author_Institution :
EE Dept., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
Recent synchronizer metastability measurements indicate degradation of MTBF with technology scaling, calling for measurement and calibration circuits in 65nm circuits and beyond. An on-chip metastability measurement circuit was fabricated in a 65nm 1.1V bulk CMOS. A fully digital on-chip measurement system is presented here that helps to characterize synchronizers in future technologies. Different types of synchronizers were measured and compared. The standard library FF is demonstrated to have lower tau value than various feedback flip-flops.
Keywords :
CMOS integrated circuits; calibration; MTBF degradation; bulk CMOS process; calibration circuit; digital on-chip measurement system; feedback flip-flop; mean between time failure degradation; on-chip metastability measurement circuit; size 65 nm; standard library FF demonstration; synchronizer metastability measurement; technology scaling; voltage 1.1 V; Clocks; Frequency measurement; Latches; Libraries; Logic gates; Semiconductor device measurement; Synchronization;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5938135
