• DocumentCode
    1998464
  • Title

    Characterization of cMUT by Dynamic Holography Microscopy

  • Author

    Sénégond, Nicolas ; Certon, Dominique ; Bernard, Jean-Edouard ; Teston, Franck

  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    2205
  • Lastpage
    2208
  • Abstract
    The comparison of numerical simulations to real cMUT behavior is essential to assess and optimize the process. For a complete characterization multiple devices (FIB, SEM, impedancemetry, laser interferometry, ...) are needed. In this context, we propose to use a full-field measurement device, a Digital Holography Microscopy (DHM Lynceetec®), which acquires static and dynamic in-plane and out-of-plane information of membranes population in a single acquisition and then provides most of required parameters. This paper presents the principle of this device, its performances comparing to other ones and its limits.
  • Keywords
    electric impedance measurement; focused ion beam technology; holography; light interferometry; micromachining; micromechanical devices; scanning electron microscopy; ultrasonic transducers; DHM Lynceetec; FIB; SEM; cMUT; data acquisition; dynamic holography microscopy; full-field measurement device; impedancemetry; laser interferometry; membranes population; Atomic force microscopy; Biomembranes; Holography; Optical interferometry; Scanning electron microscopy; Stress; Testing; Transducers; Voltage; Wavelength measurement; Dynamic Holography Microscope; Young´s modulus membrane; cMUT; initial stress membrane;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441729
  • Filename
    5441729