• DocumentCode
    1998634
  • Title

    Technological exploration of RRAM crossbar array for matrix-vector multiplication

  • Author

    Peng Gu ; Boxun Li ; Tianqi Tang ; Shimeng Yu ; Yu Cao ; Yu Wang ; Huazhong Yang

  • Author_Institution
    Dept. of E.E., Tsinghua Univ., Beijing, China
  • fYear
    2015
  • fDate
    19-22 Jan. 2015
  • Firstpage
    106
  • Lastpage
    111
  • Abstract
    The matrix-vector multiplication is the key operation for many computationally intensive algorithms. In recent years, the emerging metal oxide resistive switching random access memory (RRAM) device and RRAM crossbar array have demonstrated a promising hardware realization of the analog matrix-vector multiplication with ultra-high energy efficiency. In this paper, we analyze the impact of nonlinear voltage-current relationship of RRAM devices and the interconnect resistance as well as other crossbar array parameters on the circuit performance and present a design guide. On top of that, we propose a technological exploration flow for device parameter configuration to overcome the impact of nonideal factors and achieve a better trade-off among performance, energy and reliability for each specific application. The simulation results of a support vector machine (SVM) and MNIST pattern recognition dataset show that the RRAM crossbar array-based SVM is robust to the input signal fluctuation but sensitive to the tunneling gap deviation. A further resistance resolution test presents that a 4-bit RRAM device is able to realize a recognition accuracy of ~ 90%, indicating the physical feasibility of RRAM crossbar array-based SVM. In addition, the proposed technological exploration flow is able to achieve 10.98% improvement of recognition accuracy on the MNIST dataset and 26.4% energy savings compared with previous work.
  • Keywords
    matrix multiplication; resistive RAM; support vector machines; MNIST pattern recognition dataset; RRAM crossbar array-based SVM; analog matrix-vector multiplication; crossbar array parameters; input signal fluctuation; interconnect resistance; metal oxide RRAM device; metal oxide resistive switching random access memory device; nonideal factors; nonlinear voltage-current relationship; resistance resolution test; support vector machine; tunneling gap deviation; Accuracy; Arrays; Integrated circuit interconnections; Performance evaluation; Resistance; Support vector machines; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific
  • Conference_Location
    Chiba
  • Print_ISBN
    978-1-4799-7790-1
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2015.7058989
  • Filename
    7058989