Title :
3-D TLM Analysis of E-Plane Transitions for mm-Wave Networks
Author :
McKenzie, Wilf ; Snowden, Christopher M. ; Howes, Michael J.
Author_Institution :
Microwave Solid State Group, Department of Electrical and Electronic Engineering, Leeds University, Leeds, LS2 9JT, UK.
Abstract :
The TLM analysis technique is used to obtain the scattering parameters of arbitrarily shaped transitions and discontinuities contained in metallic enclosures. The recently introduced symmetrical condensed TLM node is used with a three-dimensional graded mesh scheme to provide accurate structure and field representation. Novel techniques for the derivation of scattering parameters from the field data are described and compared. Comparisons between measured and simulated s-parameters of E-plane transitions operating at millimetre-wave frequencies are given.
Keywords :
Circuits; Conductors; Dielectrics; Electromagnetic scattering; Finline; Microstrip; Scattering parameters; Symmetric matrices; Transmission line matrix methods; Waveguide transitions;
Conference_Titel :
Microwave Conference, 1988. 18th European
Conference_Location :
Stockholm, Sweden
DOI :
10.1109/EUMA.1988.333810
