DocumentCode :
1999043
Title :
Gate sizing and threshold voltage assignment for high performance microprocessor designs
Author :
Reimann, Tiago ; Sze, Cliff C. N. ; Reis, Ricardo
Author_Institution :
PGMicro, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
fYear :
2015
fDate :
19-22 Jan. 2015
Firstpage :
214
Lastpage :
219
Abstract :
Timing-constrained power-driven gate sizing has aroused lot of research interest after the recent two discrete gate sizing contests organized by International Symposium on Physical Design. Since then, there are plenty of research papers published and new algorithms are proposed based on the ISPD 2013 contest formulation. However, almost all (new and old) papers in the literature ignore the details of how power-driven gate sizing fits in industrial physical synthesis flows, which limits their practical usage. This paper aims at filling this knowledge gap. We explain our approach to integrate a state-of-the-art Lagrangian Relaxation-based gate sizing into our actual physical synthesis framework, and explain the challenges and issues we observed from the point of view of VLSI design flows.
Keywords :
VLSI; integrated circuit design; logic design; logic gates; microprocessor chips; Lagrangian relaxation-based gate sizing; VLSI design; actual physical synthesis framework; microprocessor design; threshold voltage assignment; Algorithm design and analysis; Logic gates; Microprocessors; Optimization; Runtime; Threshold voltage; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
978-1-4799-7790-1
Type :
conf
DOI :
10.1109/ASPDAC.2015.7059007
Filename :
7059007
Link To Document :
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