Title :
Modulation scheme analysis for high efficiency three-phase buck rectifier considering different device combinations
Author :
Guo, Ben ; Wang, Fred ; Burgos, Rolando
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
The three-phase buck-type rectifier has advantages as front-end converter for high efficiency power supplies in telecommunication and data centers. In this paper, the different commutation types of a three-phase buck rectifier with a freewheeling diode are analyzed through experiments using different semiconductor devices. Further, the switching loss of the converter is modeled and calculated for four space vector modulation schemes. It is shown that when the switches include minority carrier devices, such as Si PiN diode, IGBT and Reverse Blocking IGBT (RB-IGBT), more switching loss will occur in the commutation between two switches than between a switch and the freewheeling diode. This difference can be reduced if majority carrier devices, such as SiC Schottky diodes, are used in series with the switches. The modulator can be arranged to eliminate the specific transition which has the most switching loss. According to the analysis, each modulation scheme has its own field for high efficiency application. The advantageous modulation scheme is given for different device combinations in this paper.
Keywords :
PWM rectifiers; Schottky diodes; p-i-n diodes; power semiconductor switches; switching convertors; PIN diode; Schottky diode; SiC; carrier device; commutation type; data center power supply; four space vector modulation; front end converter; high efficiency three-phase buck rectifier; modulation scheme analysis; reverse blocking IGBT; switching loss; telecommunication power supply; three-phase buck-type rectifier; Capacitors; Junctions; Modulation; Rectifiers; Schottky diodes; Switches; Switching loss; Three-phase buck rectifier; device comparison; high-efficiency PWM;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2012 IEEE
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4673-0802-1
Electronic_ISBN :
978-1-4673-0801-4
DOI :
10.1109/ECCE.2012.6342416