Title :
Yield Optimization of Large Scale Microwave Circuits
Author :
Bandler, John W. ; Biernacki, R.M. ; Chen, S.H. ; Renault, M.L. ; Song, J. ; Zhang, Q.J.
Author_Institution :
Optimization Systems Associates Inc., P.O. Box 8083, Dundas, Ontario, Canada L9H 5E7; Simulation Optimization Systems Research Laboratory, Department of Electrical and Computer Engineering, McMaster University, Hamilton, Canada L8S 4L7.
Abstract :
In this paper we demonstrate for the first time the feasibility of yield optimization of large scale microwave circuits. A combined strategy to attack this difficult problem is proposed, which includes the use of supercomputers, efficient approximation to the circuit responses, and the use of fast, dedicated simulation techniques. We have successfully accomplished the yield optimization of a 5 channel multiplexer with 75 design and toleranced variables, 124 constraints and up to 200 statistically perturbed circuits. No microwave circuit design of this type and on this scale has ever been reported.
Keywords :
Circuit optimization; Circuit simulation; Circuit synthesis; Constraint optimization; Design optimization; Large-scale systems; Microwave circuits; Multiplexing; Supercomputers; Tunable circuits and devices;
Conference_Titel :
Microwave Conference, 1988. 18th European
Conference_Location :
Stockholm, Sweden
DOI :
10.1109/EUMA.1988.333825
