• DocumentCode
    1999377
  • Title

    Self-learning and adaptive board-level functional fault diagnosis

  • Author

    Fangming Ye ; Chakrabarty, Krishnendu ; Zhaobo Zhang ; Xinli Gu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • fYear
    2015
  • fDate
    19-22 Jan. 2015
  • Firstpage
    294
  • Lastpage
    301
  • Abstract
    Functional fault diagnosis is necessary for board-level product qualification. However, ambiguous diagnosis results can lead to long debug times and wrong repair actions, which significantly increase repair cost and adversely impact yield. A state-of-the-art functional fault diagnosis system involves several key components: (1) design of functional test programs, (2) collection of functional-failure syndromes, (3) building of the diagnosis engine, (4) isolation of root causes, and (5) evaluation of the diagnosis engine. Advances in each of these components can pave the way for a more effective diagnosis system, thus improving diagnosis accuracy and reducing diagnosis time. Machine-learning and data analysis techniques offer an unprecedented opportunity to develop an automated and adaptive diagnosis system to increase diagnosis accuracy and reduce diagnosis time. This paper describes how all the above components of an advanced diagnosis system can benefit from machine learning and information theory. Topics discussed include incremental learning, decision trees, root-cause analysis and evaluation metrics, data acquisition, and knowledge transfer.
  • Keywords
    automatic testing; decision trees; electronic engineering computing; fault diagnosis; learning (artificial intelligence); printed circuit testing; adaptive board level functional fault diagnosis; adaptive diagnosis system; automated diagnosis system; board level product qualification; data acquisition; data analysis technique; decision trees; diagnosis engine evaluation; evaluation metrics; functional failure syndromes; functional test program; incremental learning; knowledge transfer; root cause analysis; root cause isolation; self-learning fault diagnosis; Accuracy; Databases; Engines; Equations; Maintenance engineering; Mathematical model; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific
  • Conference_Location
    Chiba
  • Print_ISBN
    978-1-4799-7790-1
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2015.7059021
  • Filename
    7059021