Title :
Organic thin film transistors: Analytical modeling and structures analysis
Author :
Saxena, Shradha ; Kumar, Brijesh ; Kaushik, B.K. ; Negi, Y.S. ; Verma, G.D.
Author_Institution :
Indian Inst. of Technol., Roorkee, India
Abstract :
This paper presents massive analytical analysis of Bottom Gate Top Contact (BGTC) and Bottom Gate Bottom Contact (BGBC) structures of Organic Thin Film Transistors (OTFTs). It is preferable to have compact dc models that can be used in simulations to forecast and optimize performance of organic material based devices and circuits. Since a unified compact model is not sufficient to derive all characteristics using materials and fabrication processes, therefore, several analytical models have been proposed and subsequently their respective operating modes are described. In order to obtain current-voltage (I-V) characteristics of reliable organic device, OTFT charge drift model has been derived and converted into symmetrical compact dc model by adding subthreshold regime and channel length modulation.
Keywords :
reliability; thin film transistors; BGTC analytical analysis; I-V characteristics; OTFT charge drift model; bottom gate top contact analytical analysis; current-voltage characteristics; fabrication processes; organic material based circuits; organic material based devices; organic thin film transistor charge drift model; reliable organic device characteristics; Analytical models; Equations; Logic gates; Mathematical model; Organic thin film transistors; Analytical modeling; BGTC and BGBC structure; Compact model; Organic Thin Film Transistor;
Conference_Titel :
Recent Advances in Information Technology (RAIT), 2012 1st International Conference on
Conference_Location :
Dhanbad
Print_ISBN :
978-1-4577-0694-3
DOI :
10.1109/RAIT.2012.6194580