• DocumentCode
    1999700
  • Title

    Reduction of voltage stress in the full bridge BIBRED by duty ratio and phase shift control

  • Author

    Johnston, M.A. ; Erickson, R.W.

  • Author_Institution
    Storage Technol. Corp., Louisville, CO, USA
  • fYear
    1994
  • fDate
    13-17 Feb 1994
  • Firstpage
    849
  • Abstract
    A new control scheme is presented which provides simultaneous control of the output voltage and the energy storage capacitor voltage in the full-bridge boost integrated with buck rectifier/energy storage/DC-DC power converter (full-bridge BIBRED). The new control scheme solves the problem of wide voltage excursions for the energy storage capacitor voltage under variable load conditions. A low frequency, large signal AC equivalent circuit is presented. The steady state governing equations are given. Mode boundaries for correct operation as a high quality rectifier are established. The control circuit used to implement the new control scheme is discussed. Experimental results validate the concept of the new control scheme
  • Keywords
    bridge circuits; capacitor storage; control system analysis; equivalent circuits; insulated gate field effect transistors; phase control; power capacitors; power convertors; power transistors; rectifiers; rectifying circuits; semiconductor switches; switching circuits; voltage control; LF large signal AC equivalent circuit; boost integrated with buck rectifier/energy storage/DC-DC power converter; duty ratio; energy storage capacitor; full bridge BIBRED; high quality rectifier; mode boundaries; phase shift control; power MOSFETs; steady state governing equations; variable load; voltage stress; Bridge circuits; Capacitors; DC-DC power converters; Energy storage; Equivalent circuits; Frequency; Rectifiers; Steady-state; Stress; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 1994. APEC '94. Conference Proceedings 1994., Ninth Annual
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-1456-5
  • Type

    conf

  • DOI
    10.1109/APEC.1994.316310
  • Filename
    316310