DocumentCode
1999776
Title
Synthetic aperture focusing technique for high-resolution imaging of surface structures with high-frequency ultrasound
Author
Vogt, M. ; Opretzka, J. ; Ermert, H.
Author_Institution
High Freq. Eng. Res. Group, Ruhr-Univ. Bochum, Bochum, Germany
fYear
2009
fDate
20-23 Sept. 2009
Firstpage
1514
Lastpage
1517
Abstract
In this paper, an approach for the imaging of planar surface structures with high-frequency ultrasound in the 20 MHz frequency range is presented and evaluated. Planar material samples are placed in the far field of a single element transducer, and echo signals are acquired in a monostatic, side looking configuration during one or more scans along the azimuth direction. Synthetic aperture focusing is utilized for the reconstruction of B-mode images, which represent the echogenicity along the two-dimensional planar surface. The concept has been evaluated with a spherically focused transducer under the assumption of a virtual point source and under the approximation that spherical waves emanate from the transducer focus. Results from both, simulated echo data and measurement data from test objects, are presented and discussed.
Keywords
echo; image reconstruction; nondestructive testing; surface structure; ultrasonic focusing; ultrasonic imaging; ultrasonic transducers; B-mode images; echo signals; echogenicity; frequency 20 MHz; high-frequency ultrasound; high-resolution imaging; image reconstruction; monostatic side looking configuration; planar surface structures; simulated echo data; single element transducer; spherically focused transducer; synthetic aperture focusing technique; virtual point source; Azimuth; Focusing; Frequency; High-resolution imaging; Image reconstruction; Surface reconstruction; Surface structures; Testing; Ultrasonic imaging; Ultrasonic transducers; Non-destructive evaluation; high-frequency ultrasound; side looking airborne radar; synthetic aperture focusing technique; synthetic aperture radar;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location
Rome
ISSN
1948-5719
Print_ISBN
978-1-4244-4389-5
Electronic_ISBN
1948-5719
Type
conf
DOI
10.1109/ULTSYM.2009.5441785
Filename
5441785
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