• DocumentCode
    1999850
  • Title

    Dynamic Threshold Body- And Gate-coupled SOI ESD Protection Networks

  • Author

    Voldman, S. ; Assaderaghi, E. ; Mandelman, J. ; Hsu, L. ; Shahidi, G.

  • Author_Institution
    IBM
  • fYear
    1997
  • fDate
    25-25 Sept. 1997
  • Firstpage
    210
  • Lastpage
    220
  • Keywords
    CMOS technology; Electrostatic discharge; Isolation technology; MOSFET circuits; Microelectronics; Protection; Robustness; Semiconductor diodes; Silicon on insulator technology; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    1-878303-69-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.1997.634245
  • Filename
    634245
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1999850