Title :
Dynamic Threshold Body- And Gate-coupled SOI ESD Protection Networks
Author :
Voldman, S. ; Assaderaghi, E. ; Mandelman, J. ; Hsu, L. ; Shahidi, G.
Keywords :
CMOS technology; Electrostatic discharge; Isolation technology; MOSFET circuits; Microelectronics; Protection; Robustness; Semiconductor diodes; Silicon on insulator technology; Substrates;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
DOI :
10.1109/EOSESD.1997.634245
