DocumentCode :
2000188
Title :
Robust Synchronization for 3GPP LTE System
Author :
Xu, Wen ; Manolakis, Konstantinos
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
fYear :
2010
fDate :
6-10 Dec. 2010
Firstpage :
1
Lastpage :
5
Abstract :
This paper addresses problems related to time and frequency synchronization as well as blind CP (cyclic prefix) type identification in 3GPP LTE system. We start with a general framework based on maximum likelihood (ML) parameter estimation. Then, simplified practical algorithms for estimating time and frequency offset as well as blind CP length are described. Finally, a robust hierarchical scheme is proposed. Specifically, the CP based lagged auto-correlation is first employed to identify the CP type, estimate the carrier frequency offset (CFO), and grossly determine the symbol timing, and then the pilot (i.e. the LTE primary synchronization signal) based cross-correlation is used to more accurately determine the symbol and frame timing. A solution is given to the problem with unequal-length symbols, such as the symbols with the normal CP specified in the LTE. The proposed hierarchical scheme has both low complexity and high accuracy and can be realized without hardware support.
Keywords :
3G mobile communication; Long Term Evolution; correlation methods; frequency estimation; maximum likelihood estimation; synchronisation; 3GPP LTE system; CFO; LTE primary synchronization signal; ML parameter estimation; based lagged auto-correlation; blind CP length; blind CP type identification; carrier frequency offset estimation; cross-correlation; cyclic prefix type identification; frame timing; frequency synchronization; maximum likelihood parameter estimation; robust hierarchical scheme; robust synchronization; symbol timing; time offset estimation; time synchronization; Correlation; Frequency estimation; Maximum likelihood estimation; OFDM; Synchronization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Global Telecommunications Conference (GLOBECOM 2010), 2010 IEEE
Conference_Location :
Miami, FL
ISSN :
1930-529X
Print_ISBN :
978-1-4244-5636-9
Electronic_ISBN :
1930-529X
Type :
conf
DOI :
10.1109/GLOCOM.2010.5684054
Filename :
5684054
Link To Document :
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