• DocumentCode
    2000239
  • Title

    Uniform, stable and high integrated field emitter arrays for high performance displays and vacuum microelectronic switching devices

  • Author

    Nakamoto, M. ; Hasegawa, T. ; Fukuda, K.

  • Author_Institution
    Mater. & Devices Labs., Toshiba Corp., Kawasaki, Japan
  • fYear
    1997
  • fDate
    10-10 Dec. 1997
  • Firstpage
    717
  • Lastpage
    720
  • Abstract
    Extremely uniform, stable and high integrated field emitter arrays (FEAs) have been developed by the Transfer Mold emitter fabrication method to realize high performance displays and vacuum microelectronic switching devices for the first time. Transfer Mold FEAs having high emitter density of 7,840,000 tips/cm/sup 2/, containing 9,400,000 emitter tips, one of the highest value reported in the world to date, have demonstrated the lowest value of less than 0.7% of emission fluctuation in the world, and highly uniform, no defect, and flickerless fluorescence. The principle of the vacuum microelectronic switching devices also has been proposed and experimentally verified for the first time by applying high anode voltage of /spl plusmn/1 kV, which will be capable of decreasing the size and the electric power loss of the high voltage electric power converters using conventional semiconductor devices such as Light-triggered thyristors (LTT) and Gate Turn Off thyristors (GTO) to less than 1/100 and 1/10 of them, respectively.
  • Keywords
    display devices; power semiconductor switches; semiconductor technology; vacuum microelectronics; 1 kV; display; emission fluctuation; field emitter array; fluorescence; gate turn off thyristor; high voltage electric power converter; light-triggered thyristor; semiconductor device; transfer mold emitter fabrication; vacuum microelectronic switching device; Anodes; Displays; Fabrication; Field emitter arrays; Fluorescence; Microelectronics; Power semiconductor switches; Switching converters; Thyristors; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4100-7
  • Type

    conf

  • DOI
    10.1109/IEDM.1997.650483
  • Filename
    650483