DocumentCode :
2000293
Title :
Design Patterns Reuse for Real Time Embedded Software Development
Author :
de Souza Pereira Moreira, G. ; Montini, Denis Ávila ; Silva, Daniela América da ; Cardoso, Felipe Rafael Motta ; Dias, Luiz Alberto Vieira ; Cunha, Adilson Marques da
Author_Institution :
Inst. Tecnol. de Aeronaut. - ITA
fYear :
2009
fDate :
27-29 April 2009
Firstpage :
1421
Lastpage :
1427
Abstract :
This article describes software reuse components using C language on IBM-Rational Rose Real Time (RRRT) environment. In it a software development process becomes refined by means of a design pattern reuse. Its main contribution meets definition of a process for construction of a Data Logger Platform. Use of design pattern in an Integrated Computer Aided Software Engineering Environment allows definition of an industrial process aimed for future systematic reuse. Direction lines from Rational Unified Process (RUP) had recently helped undergraduate and graduate students from the Brazilian Aeronautics Institute of Technology (ITA) to create a fertile scene for practical applications of design pattern concepts. A Computer Software Component was constructed with attributes and generic methods in order to make possible its reuse. As a result of this process, members of ITA Software Engineering Research Group had generated a quality report previously improved to carry out classroom work, and proposed a specific data management design pattern for input and output.
Keywords :
C language; computer science education; embedded systems; object-oriented programming; software reusability; C language; IBM-Rational Rose real time embedded software development; data logger platform; design pattern reuse; integrated computer aided software engineering environment; rational unified process; software reuse component; Application software; Computer aided software engineering; Computer industry; Construction industry; Embedded software; Layout; Programming; Quality management; Refining; Software engineering; CMMi; Design Patterns; I-CASE-E; RUP; UML-RT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology: New Generations, 2009. ITNG '09. Sixth International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-3770-2
Electronic_ISBN :
978-0-7695-3596-8
Type :
conf
DOI :
10.1109/ITNG.2009.171
Filename :
5070826
Link To Document :
بازگشت