• DocumentCode
    2000353
  • Title

    Contribution to improving the spatial resolution of a pulsed electro acoustic cell measurement: An analysis of acoustics waves propagation

  • Author

    Arnaout, M. ; Berquez, L. ; Baudoin, F. ; Payan, D.

  • Author_Institution
    LAPLACE (Lab. plasma et conversion d´´energie), Univ. de Toulouse, Toulouse, France
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work aims at improving the spatial resolution for the pulsed electro-acoustic method - PEA. Whatever the measurement principle considered, the best spatial resolution achieved so far is of the order of several micrometers, being at most 10μm in case of the PEA method. This limit constitutes a drawback when considering rather thin insulating layers (order of tens of μms), as the case in some capacitors or in films layed on outer parts of satellites. Also, a better resolution is expected to provide a better description of charge generation in insulations at metal dielectric interfaces or under low energy electron beam. This work is focused on acoustic waves propagation inside the PEA cell and the analysis of influence of piezoelectric transducer geometry´s of the quality of output voltage signal.
  • Keywords
    acoustic wave propagation; battery charge measurement; dielectric materials; insulating materials; piezoelectric transducers; pulsed electroacoustic methods; PEA method; acoustic waves propagation; charge generation; energy electron beam; insulation; metal dielectric interfaces; piezoelectric transducer geometry; pulsed electroacoustic cell measurement; spatial resolution; Acoustic measurements; Acoustic waves; Dielectrics; Electrodes; Materials; Mathematical model; Acoustic wave propagation; Space charge; piezoelectric conversion; pulsed electroacoustic method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5567914
  • Filename
    5567914