Recent developments in integrated spectrometers

Author

Delage, Andrk ; Bidnyk, Serge ; Cheben, Pavel ; Dossou, Kokou ; Janz, Siegfried ; Lamontagne, Boris ; Packirisamy, Muthukumaran ; Xu, Dan-Xia

Author_Institution

Inst. for Microstruct. Sci., Nat. Res. Council of Canada, Ottawa, Ont., Canada

Volume

2

fYear

2004

fDate

4-8 July 2004

Firstpage

78

Abstract

In the 1990s, the Institute for Microstructural Sciences has maintained a research project on wavelength division multiplexing (WDM) based on integrated echelle gratings spectrometers. Major obstacles to the application of these spectrometers to telecommunications, such as channel wavelength accuracy, insertion loss, birefringence, polarisation dependent loss, compliance to flat band, and crosstalk, have been largely resolved. This technology has been transferred to the industry and our current efforts concentrate on integrated spectrometers in high index contrast waveguides. This paper reviews the advances in the echelle grating demultiplexers and in the miniaturisation of arrayed waveguide grating (AWG) spectrometers.

Keywords

arrayed waveguide gratings; demultiplexing equipment; spectrometers; wavelength division multiplexing; AWG spectrometers; Institute for Microstructural Sciences; WDM; arrayed waveguide grating; demultiplexers; high index contrast waveguides; integrated echelle gratings spectrometers; miniaturisation; wavelength division multiplexing; Arrayed waveguide gratings; Bragg gratings; Diffraction gratings; Optical films; Optical filters; Optical interferometry; Optical waveguides; Space technology; Spectroscopy; Wavelength division multiplexing;

fLanguage

English

Publisher

ieee

Conference_Titel

Transparent Optical Networks, 2004. Proceedings of 2004 6th International Conference on

Print_ISBN

0-7803-8343-5

Type

conf

DOI

10.1109/ICTON.2004.1361973

Filename

1361973