DocumentCode
2000730
Title
Terahertz spectroscopy and imaging for material analysis in conservation science
Author
Fukunaga, Kaori ; Hosako, Iwao ; Picollo, Marcello
Author_Institution
Nat. Inst. of Inf. & Commun. Technol., Koganei, Japan
fYear
2010
fDate
4-9 July 2010
Firstpage
1
Lastpage
4
Abstract
Terahertz (THz) waves can penetrate opaque materials and fingerprint spectra appear as those in infrared bands. The technique is expected to be used as a new non-invasive analysis method for various materials. Time domain reflection imaging, in particular, uses THz pulses that propagate in specimens, and in this technique, pulses reflected from the internal boundaries of the specimen indicate the internal structure. We have developed a spectral database of painting materials, and applied THz time domain imaging for analysis of artworks. Experimental results, including first ever non-invasive cross section image of a tempera masterpiece, proved that THz wave can observe layer structure of the artwork from the wood support, gesso preparation layers, and the painting layer. This technique should also be useful to detect internal defect of various types of opaque dielectric materials such as multi layer insulations.
Keywords
art; painting; terahertz spectroscopy; terahertz wave imaging; THz time domain imaging; artwork; conservation science; gesso preparation layers; internal defect; material analysis; multi layer insulations; opaque dielectric materials; painting materials; tempera masterpiece; terahertz imaging; terahertz spectroscopy; time domain reflection imaging; wood support; Imaging; Materials; Painting; Pigments; Reflection; Spectroscopy; Time domain analysis; cultural heritage; terahertz;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location
Potsdam
Print_ISBN
978-1-4244-7945-0
Electronic_ISBN
978-1-4244-7943-6
Type
conf
DOI
10.1109/ICSD.2010.5567932
Filename
5567932
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