Title :
A high temperature ultrafast isolated converter to turn-off normally-on SiC JFETs
Author :
Dubois, Fabien ; Sorel, Stéphane ; Dhokkar, Sonia ; Meuret, Régis ; Bergogne, Dominique ; Martin, Christian ; Allard, Bruno ; Morel, Hervé ; Wang, Ruxi
Author_Institution :
SAFRAN Power Div., Hispano-Suiza - SAFRAN, Moissy-Cramayel, France
Abstract :
Silicon Carbide (SiC) components are accepted devices for high temperature and high efficiency applications. Normally-on SiC JFETs are now commercialized and will be used in future power converters. However, such devices are conducting when not driven with a sufficient negative voltage, which can lead to safety issues during start-up or abnormal operation of the gate driver. Therefore, it is needed to generate an auxiliary negative voltage to turn-off the JFET in order to protect the system. Moreover, insulation is necessary to cover all failure modes. Prior papers presented solution to protect such devices but no high temperature isolated solution were demonstrated. In this paper, a solution to protect JFETs used in a high temperature (200°C) voltage source inverter is proposed. The protection circuit, components selection and characterizations for high temperature application are detailed. Experimental results are provided and validate the design of the isolated normally-on protection circuit up to 200°C.
Keywords :
failure analysis; high-temperature techniques; invertors; junction gate field effect transistors; power convertors; silicon compounds; wide band gap semiconductors; SiC; abnormal operation; components selection; failure modes; gate driver; high efficiency applications; high temperature application; high temperature applications; high temperature ultrafast isolated power converter; isolated normally-on protection circuit; negative voltage; temperature 200 degC; turn-off normally-on JFET; voltage source inverter; JFETs; Logic gates; Regulators; Silicon carbide; Temperature measurement; Threshold voltage; Voltage control;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2012 IEEE
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4673-0802-1
Electronic_ISBN :
978-1-4673-0801-4
DOI :
10.1109/ECCE.2012.6342486