DocumentCode :
2000856
Title :
Protection of high voltage power and programming pins
Author :
Maloney, Timothy J. ; Parat, Krishna ; Clark, Neal K. ; Darwish, Ali
Author_Institution :
Intel Corp. RN4-40, 2200 Mission College Blvd. Santa Clara, CA 95052
fYear :
1997
fDate :
25-25 Sept. 1997
Firstpage :
246
Lastpage :
254
Keywords :
Circuits; Clamps; Diodes; Electrostatic discharge; FETs; Leakage current; Pins; Power supplies; Protection; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
Type :
conf
DOI :
10.1109/EOSESD.1997.634249
Filename :
634249
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2000856
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