DocumentCode :
2000900
Title :
An improved pulsed electroacoutic system for space charge measurement under AC conditions
Author :
Xu, Z. ; Zhao, J. ; Chen, G.
Author_Institution :
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
fYear :
2010
fDate :
4-9 July 2010
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, an improved space charge measurement system based on the pulsed electro acoustic technique (PEA) is presented. The new system gives an essential way to examine the role of space charge in electrical aging process under AC conditions. The system setup for AC measurement is presented and detailed in this paper with comparison to the old system. There are two features with improved PEA system. A pulse generator with a 3 kHz repetition rate is utilized to reduce the measurement time. The Eclipse data acquisition system is used to achieve the high data acquisition rate. The results which were taken from both old and new PEA system show that heterocharge can be formed in the region close to the lower electrode under AC electric field. Apparently the results captured from the new system have better phase resolution than the old system. The space charge decay profile measured by the new system can reflect vividly on the charge dynamically changing. The utmost space charge information was saved as the measurement time was dramatically shortened by theσ improved system.
Keywords :
ageing; charge measurement; pulsed electroacoustic methods; space charge; AC conditions; Eclipse data acquisition system; electrical aging process; pulse generator; pulsed electro acoustic technique; pulsed electroacoustic system; space charge decay profile; space charge measurement system; Charge measurement; Pulse generation; Pulse measurements; Space charge; Stress; Stress measurement; Voltage measurement; AC electric stress; Eclipse; PEA; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
Type :
conf
DOI :
10.1109/ICSD.2010.5567940
Filename :
5567940
Link To Document :
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