DocumentCode :
2001579
Title :
The measurement of series and shunt resistances of the silicon solar cell based on LabVIEW
Author :
Ma, Leikai ; Xu, Liang ; Zhang, Kunpeng ; Wu, Wei ; Ma, Zhongquan
Author_Institution :
Dept. of Phys., Shanghai Univ., Shanghai, China
fYear :
2011
fDate :
16-18 Sept. 2011
Firstpage :
2711
Lastpage :
2714
Abstract :
Based on LabVIEW, the measurement system of I-V characteristics of solar energy is designed with a solar simulator, a Keithley 2400 Source Meter and a GPIB port. The system can quickly describe the I-V characteristic curves and calculate the basic characteristic parameters and focus on the analysis of the series resistance (Rs) and shunt resistance (Rsh). The results of the measurement demonstrate that the system can precisely measure every parameter of the solar cell especially the series resistance (Rs) and shunt resistance (Rsh), which is of commercial value.
Keywords :
electric reactance measurement; elemental semiconductors; silicon; solar cells; virtual instrumentation; LabVIEW; series measurement; shunt resistances measurement; silicon solar cell; solar energy; Electrical resistance measurement; Equations; Immune system; Mathematical model; Photovoltaic cells; Resistance; Temperature measurement; I-V characteristic curve; LabVIEW; series resistance; shunt resistance; solar cell;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Control Engineering (ICECE), 2011 International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4244-8162-0
Type :
conf
DOI :
10.1109/ICECENG.2011.6058342
Filename :
6058342
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2001579
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