DocumentCode :
2001605
Title :
High-speed resonant gate driver with controlled peak gate voltage for silicon carbide MOSFETs
Author :
Anthony, Philip ; McNeill, Neville ; Holliday, Derrick
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol, UK
fYear :
2012
fDate :
15-20 Sept. 2012
Firstpage :
2961
Lastpage :
2968
Abstract :
Parasitic inductance in the gate path of a Silicon Carbide MOSFET places an upper limit upon the switching speeds achievable from these devices, resulting in unnecessarily high switching losses due to the introduction of damping resistance into the gate path. A method to reduce switching losses is proposed, using a resonant gate driver to absorb parasitic inductance in the gate path, enabling the gate resistor to be removed. The gate voltage is maintained at the desired level using a feedback loop. Experimental results for a 1200 V Silicon Carbide MOSFET gate driver are presented, demonstrating switching loss of 230 μJ at 800 V, 10 A. This represents a 20% reduction in switching losses in comparison to conventional gate drive methods.
Keywords :
damping; power MOSFET; silicon compounds; wide band gap semiconductors; SiC; controlled peak gate voltage; conventional gate drive methods; damping resistance; feedback loop; gate path; gate resistor; high switching losses; high-speed resonant gate driver; parasitic inductance; silicon carbide MOSFET; switching speeds; voltage 1200 V; Inductance; Logic gates; MOSFETs; Silicon carbide; Switches; Switching loss; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2012 IEEE
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4673-0802-1
Electronic_ISBN :
978-1-4673-0801-4
Type :
conf
DOI :
10.1109/ECCE.2012.6342520
Filename :
6342520
Link To Document :
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