• DocumentCode
    2001668
  • Title

    Hybrid Abnormal Patterns Recognition of Control Chart Using Support Vector Machining

  • Author

    Wang, Xiaoh

  • Author_Institution
    Lab. of Numerical Control ofJiangxi Province, Jiujiang Univ., Jiujiang, China
  • Volume
    2
  • fYear
    2008
  • fDate
    13-17 Dec. 2008
  • Firstpage
    238
  • Lastpage
    241
  • Abstract
    A novel control chart pattern recognition system using support vector machine(SVM) is presented. Pattern recognition techniques have been wildly applied to identify abnormal patterns in control charts. Abnormal patterns exhibited by such charts can be associated with certain assignable causes affecting the process. Most of the existing recognition method are capable of recognizing a single abnormal pattern, however, a practical situation is concurrent patterns where two abnormal patterns may exist together. The presented method can enhance recognition capability and accuracy, and avoid the disadvantages, such us over-fitting, weak normalization capability, etc., of artificial neural network(ANN) method. Furthermore, it can recognize these hybrid abnormal patterns existing in control chart by combining voting and binary tree methods. Simulation experimental results are given to demonstrate that, compared with ANN recognition methods, the method proposed is superior in classifying shift, trend and cyclic patterns, and realized the recognition for hybrid abnormal pattern in control charts.
  • Keywords
    control charts; neural nets; pattern recognition; support vector machines; trees (mathematics); artificial neural network; binary tree methods; control chart; hybrid abnormal patterns recognition; over fitting; pattern recognition system; support vector machine; voting methods; weak normalization capability; Artificial neural networks; Binary trees; Classification tree analysis; Computational intelligence; Control charts; Machining; Pattern recognition; Security; Support vector machine classification; Support vector machines; control chart; hybrid abnormal patterns; pattern recognition; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Security, 2008. CIS '08. International Conference on
  • Conference_Location
    Suzhou
  • Print_ISBN
    978-0-7695-3508-1
  • Type

    conf

  • DOI
    10.1109/CIS.2008.13
  • Filename
    4724773