Title :
GaAs digital integrated circuits-a review from silicon point of view for designing ultra-fast VLSI circuits
Author :
Srivastava, A. ; Dubey, M.
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, New Paltz, NY, USA
Abstract :
High-performance systems designed from silicon VLSI technology limited in speed performance could be designed from GaAs technology due to its high electron mobility, large saturation drift velocity at lower field strengths, high intrinsic bulk resistivity, strong radiation resistance, broad operating temperature range, and integration of electronics and optics. Various aspects of GaAs design and technology are reviewed from this point of view. Circuit design approaches, logic families, and the choice of design methodology are discussed
Keywords :
III-V semiconductors; VLSI; digital integrated circuits; gallium arsenide; integrated circuit technology; integrated logic circuits; GaAs; HFET; JFET; MESFET; circuit design; design methodology; digital integrated circuits; logic families; speed performance; ultra-fast VLSI circuits; Conductivity; Electron mobility; Electron optics; Gallium arsenide; Integrated circuit technology; Integrated optics; Optical design; Silicon; Temperature distribution; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
Conference_Location :
Champaign, IL
DOI :
10.1109/MWSCAS.1989.102083