Title :
Numerical modeling of surface potential decay of corona charged polymeric material
Author :
Chen, G. ; Zhao, J. ; Zhuang, Y.
Author_Institution :
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
Abstract :
Monitoring surface potential decay of a corona charged polymeric material is a powerful tool to characterize electrical properties such as charge transport, trapping/detrapping and recombination. Over the years, various models have been proposed to describe charge transport within the material and one common feature in these models is that they were all based on single charge injection from the charged surface. Recent experimental evidence on the corona charged polyethylene film shows clearly that bipolar charge injection takes place in corona charged sample especially at high surface potentials. A new model based on a bipolar charge injection has been proposed. In the present paper numerical simulations have been carried out using the model and results have been compared with surface potential decays obtained from 50 μm low density polyethylene films after corona charged. The simulation results show that several features experimentally observed can be readily revealed using the bipolar charge injection model. More importantly, the modeling can illustrate charge dynamics across the sample and allows one to extract parameters that are associated with material properties.
Keywords :
charge injection; corona; numerical analysis; polymer films; surface potential; bipolar charge injection model; charge transport; corona charged polyethylene film; corona charged polymeric material; electrical property; low density polyethylene films; numerical modeling; numerical simulations; parameter extraction; single charge injection; size 50 mum; surface potential decay monitoring; Charge carrier processes; Corona; Electric potential; Materials; Numerical models; Surface charging; Surface treatment; bipolar charge injection; corona charging; numerical simualiton; polymeric material; surface potential decay;
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
DOI :
10.1109/ICSD.2010.5567997