• DocumentCode
    2002128
  • Title

    Depth encoding of point-of-interaction in thick scintillation cameras

  • Author

    Tomitani, T. ; Futami, Y. ; Izeki, Y. ; Kouda, S. ; Nishio, T. ; Murakami, T. ; Kitagawa, A. ; Kanazawa, M. ; Urakabe, E. ; Shinbo, M. ; Kanai, T.

  • Author_Institution
    Nat. Inst. of Radiol. Sci., Chiba, Japan
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1182
  • Abstract
    Scintillation cameras of thick NaI(Tl) crystals without collimators have been used in the field of gamma ray astronomy, positron camera and PET. In such cases, gamma rays enter into a crystal at various angles, so that the depth of interaction causes position errors in two-dimensional position encoding. In principle, the light distribution inside the crystal depends on the depth of the light source, from which depth information may be derived. The authors introduced a position arithmetic based on maximum likelihood estimation and investigated the effect of light reflection of the surface opposite to PMT array. It turned out that depth encoding is impossible with diffusive reflection, while depth information can be obtained with mirror reflection, semi-opaque and opaque reflection at a cost of spatial resolution. The compromise must be made between the spatial resolution and the depth resolution, which may depend on the specific applications
  • Keywords
    cameras; image coding; image resolution; medical image processing; photomultipliers; positron emission tomography; NaI:Tl; PET; depth encoding; light distribution inside crystal; light source depth; medical diagnostic imaging; medical instrumentation; nuclear medicine; point-of-interaction; position error; thick NaI(Tl) crystals; thick scintillation cameras; Astronomy; Cameras; Collimators; Crystals; Encoding; Gamma rays; Light sources; Optical reflection; Positron emission tomography; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5696-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1999.842770
  • Filename
    842770