• DocumentCode
    2002207
  • Title

    Blocking effect of PVF on space charge injection into low density polyethylene

  • Author

    Xia, Junfeng ; Zhang, Yewen ; An, Zhenlian ; Zheng, Feihu

  • Author_Institution
    Shanghai Key Lab. of Special Artificial Microstructure Mater. & Technol., Tongji Univ., Shanghai, China
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Space charges formed in low-density polyethylene (LDPE) are usually considered to be one of the most important factors in ageing and breakdown mechanism of polymer. But the source of space charge and accumulation process are still ambiguous. In this paper, a polyvinyl fluoride (PVF) film was used as a blocking layer to study the mechanism of space charge injection in LDPE under high direct current stress. The space charge distributions in LDPE specimens with and without the blocking layer are measured by pressure wave propagation (PWP) method. The experimental results indicated that: (1) PVF film could effectively prevent both of the hole and electron injection from electrodes; (2) charge injected from the electrode is the dominant source of space charge accumulation in our LDPE specimens. (3) different preparation conditions can make the specimens exhibit different charge injection characteristics.
  • Keywords
    polyethylene insulation; space charge; LDPE specimens; accumulation process; ageing mechanism; blocking effect; breakdown mechanism; high direct current stress; low density polyethylene; polyvinyl fluoride film; pressure wave propagation; space charge distributions; space charge injection; Anodes; Cathodes; Films; Polyethylene; Space charge; blocking layer; low density polyethylene; polyvinyl fluoride (PVF); space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5568005
  • Filename
    5568005