Title :
Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236)
Abstract :
The following topics were dealt with: embedded memory design aids; embedded DRAM; algorithms and testing techniques; DRAM fault modeling; SRAM characterization and test; CAM testing; unique fault models; memory repair
Keywords :
DRAM chips; SRAM chips; content-addressable storage; embedded systems; fault diagnosis; integrated circuit design; integrated circuit testing; memory architecture; CAM testing; DRAM fault modeling; SRAM characterization; SRAM test; algorithms; embedded DRAM; embedded memory design aids; fault models; memory design; memory repair; memory technology; testing techniques;
Conference_Titel :
Memory Technology, Design and Testing, 1998. Proceedings. International Workshop on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8494-1
DOI :
10.1109/MTDT.1998.705937
