DocumentCode
2002298
Title
A Methodology Used to Optimize Probe Selection for Fault Localization
Author
Qiao, Yan ; Qiu, Xuesong ; Cheng, Lu ; Meng, Luoming
Author_Institution
State Key Lab. of Networking & Switching Technol., Beijing Univ. of Posts & Telecommun., Beijing, China
fYear
2010
fDate
6-10 Dec. 2010
Firstpage
1
Lastpage
5
Abstract
Due to the efficiency and adaptability, the active probing technique has become an attractive tool for fault localization in large and complex computer networks. It performs diagnosis by appropriately selecting the probes and analyzing the results. However, selecting an optimal probe set in such environment has been proven to be NP-hard problem. And, even the current approximate methods that can achieve near-optimal solutions have exponential computing time with the network size. To address this issue, we utilize the properties of conditional independence and directed-separation of Bayesian network, and propose a novel methodology which is used to estimate the approximate conditional independence of probes. According to the methodology, the model can be divided into several approximate independent subsets, on which the probes could be selected respectively. Furthermore, by integrating the methodology with a former representative probe selection algorithm which is called BPEA, we design a new efficient probe selection algorithm. Several experiments are given afterwards to show how our algorithm outperforms BPEA. And we also present that our algorithm can be used in large-scale computer networks while the former one can not. Moreover, the methodology can be applied to other probing based techniques as well.
Keywords
belief networks; computer networks; BPEA; Bayesian network; NP-hard problem; active probing technique; fault localization; large-scale computer networks; probe selection; Approximation algorithms; Approximation methods; Bayesian methods; Noise; Peer to peer computing; Probes; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Global Telecommunications Conference (GLOBECOM 2010), 2010 IEEE
Conference_Location
Miami, FL
ISSN
1930-529X
Print_ISBN
978-1-4244-5636-9
Electronic_ISBN
1930-529X
Type
conf
DOI
10.1109/GLOCOM.2010.5684146
Filename
5684146
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