DocumentCode :
2002403
Title :
Expert system for project management
Author :
Sachdeva, R. ; Namburi, N.R.
Author_Institution :
Siemens Ltd., New Delhi, India
fYear :
1993
fDate :
17-18 Dec 1993
Firstpage :
212
Lastpage :
220
Abstract :
With the globalisation of business, the implementation of turnkey projects is becoming increasingly complex. Inputs from different and diverse sources, coordination and synchronizing of delivery schedules, and cost-reduction targets call for powerful, effective and intelligent tools. Without such tools, an unexpected situation can put the project manager under stress which can consequently lead to wrong decisions. Therefore, there is a necessity today for online systems that can diagnose the causes of problems, help the project management to arrive at quick and proper decisions as well as identify ways to take corrective actions. The important parameters for online implementation of such a diagnostic system are the accuracy and speed of the diagnosis. The concepts used to realise these parameters have a strong influence on the selection of the most suitable tool for a given application. Current concepts such as establish-refine and hypothesis-test are explained. Furthermore, the representation of the knowledge in data files along with an appropriate illustration are also presented
Keywords :
diagnostic expert systems; expert systems; knowledge representation; project engineering; project management; corrective actions; cost-reduction targets; data files; delivery schedules; diagnostic system; establish-refine; expert system; globalisation; hypothesis-test; intelligent tools; knowledge representation; online systems; project management; project manager; turnkey projects; Expert systems; Globalization; Humans; Knowledge acquisition; Machine intelligence; Power system management; Problem-solving; Project management; Stress; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering Management Conference, 1993. Managing Projects in a Borderless World. Pre Conference Proceedings., 1993 IEEE International
Conference_Location :
New Delhi
Print_ISBN :
0-7803-1763-7
Type :
conf
DOI :
10.1109/IEMC.1993.316474
Filename :
316474
Link To Document :
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