Title :
Enhancing Sequential LEC Using a Cumulative Verification Methodology
Author :
Sheeley, Nathan ; Pena, Nico ; Waheed, Irfan ; Nodine, Mark
Author_Institution :
Intrinsity, Inc., Austin, TX
Abstract :
This paper describes a methodology for verifying sequentially optimized designs using sequential equivalence checking. The problems associated with verifying large designs with complex changes using current sequential equivalence checking tools are presented. This methodology aims to solve some of these problems by simplifying either the size of the circuit or the number of changes presented to the checking tool at any one time. Key to this methodology is the use of a tool called rapport for generating wrappers for the blocks being verified. Finally, the challenges with the methodology and a case study of using the methodology to verify a RISC core are presented.
Keywords :
formal verification; logic design; microprocessor chips; complex design optimization; complex microprocessor verification; cumulative verification methodology; rapport tool; sequential logical equivalence checking; sequential optimized design verification; stand-alone wrapper; Circuits; Clocks; Design optimization; Formal verification; Latches; Logic design; Microprocessors; Pipelines; Reduced instruction set computing; Sequential analysis; equivalence; formal; rapport; sequential; verification;
Conference_Titel :
Microprocessor Test and Verification, 2008. MTV '08. Ninth International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-3682-8
DOI :
10.1109/MTV.2008.10