Title :
The effect of accelerated UV-ageing on the dielectric properties of PVC, PTFE and HDPE
Author :
Mergos, John A. ; Athanassopoulou, Maria D. ; Argyropoulos, Theodore G. ; Dervos, Constantine T. ; Vassiliou, Panayota
Author_Institution :
Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
Abstract :
In this work the dielectric response of three commonly used polymeric insulating materials, namely polyvinyl chloride (PVC), polytetrafluoroethylene (PTFE) and high-density polyethylene (HDPE), was measured after applying combined action of UV-radiation and condensation (humidity and heat) in an Accelerated Weathering Tester apparatus. Test samples were planar with a 2 mm thickness. For both aged and non-aged samples, the dielectric properties (relative dielectric constant κ´ and dissipation factor tanδ) were recorded in a frequency range 20 Hz-1 GHz. The induced changes on complex permittivity after applying UV/condensation cycles were described. The accelerated ageing led to surface color differentiations for PVC and HDPE. Finally, Fourier Transform Infrared (FTIR) spectroscopy measurements on the sample surfaces investigated the chemical stability of the tested materials.
Keywords :
Fourier transforms; ageing; infrared spectroscopy; insulating materials; permittivity; polymers; ultraviolet radiation effects; Fourier transform infrared spectroscopy measurement; HDPE; PTFE; PVC; UV-condensation cycle; UV-radiation action; accelerated UV-ageing; accelerated weathering tester apparatus; chemical stability; complex permittivity; dielectric property; dielectric response; high-density polyethylene; polymeric insulating materials; polytetrafluoroethylene; polyvinyl chloride; surface color differentiation; Aging; Color; Dielectric constant; Dielectric measurements; Frequency measurement; Materials; accelerated aging; color measurement; dipolar polarization; loss tangent; polymer insulator; ultra-violet radiation;
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
DOI :
10.1109/ICSD.2010.5568019