Title :
Ultrasonic chirplet signal decomposition for defect evaluation and pattern recognition
Author :
Lu, Yufeng ; Oruklu, Erdal ; Saniie, Jafar
Author_Institution :
Dept. of Electr. & Comput. Eng., Bradley Univ., Peoria, IL, USA
Abstract :
In this study, a quantitative method using chirplet signal decomposition (CSD) is presented for pattern recognition and defect characterization. The CSD algorithm is utilized to decompose the ultrasonic signal into a linear combination of chirplets, and efficiently estimate the echo parameters. These parameters can be correlated to the structure of defects. For experimental studies, planar and focused transducers with different center frequencies have been used for testing the embedded defects in specimen at normal or oblique refracted angles. It has been shown that the CSD successfully associates the estimated chirplets and their parameters as a quantitative method to characterize defects.
Keywords :
acoustic signal processing; crystal defects; echo; pattern recognition; ultrasonic materials testing; center frequency; defect evaluation; echo parameter; embedded defects; linear chirplet combination; pattern recognition; ultrasonic chirplet signal decomposition; Amplitude estimation; Chirp; Frequency estimation; Parameter estimation; Pattern recognition; Radar scattering; Signal processing algorithms; Signal resolution; Testing; Ultrasonic transducers; Chirplet signal decomposition; Ultrasonic NDE; pattern recognition; quantitative evaluation;
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
DOI :
10.1109/ULTSYM.2009.5441907