DocumentCode :
2002637
Title :
Property Analysis and Design Understanding in a Quality-Driven Bounded Model Checking Flow
Author :
Kuhne, Ulrich ; Grosse, Daniel ; Drechsler, Rolf
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen
fYear :
2008
fDate :
8-10 Dec. 2008
Firstpage :
88
Lastpage :
93
Abstract :
In the design process of digital systems, functional verification is a major issue. Generally, formal methods like bounded model checking (BMC) offer the highest quality of the verification results, especially when used in combination with techniques that check if a set of properties forms a complete specification of a design. However, in contrast to simulation-based methods, like random testing, formal verification requires a detailed knowledge of the design implementation. Formalizing a specification as a set of properties is a tedious and time consuming process. In this paper, we show the application of techniques to aid the verification engineer in writing properties in a quality-driven BMC flow. The first method can be used to remove redundant assumptions from properties and to separate different scenarios. The second technique, here called inverse property checking, takes an expected behavior of a design and automatically generates valid properties that can be checked for conformance with a specification. Both techniques can serve to reduce the number of iterations to obtain full coverage, when integrated with the verification flow. The benefits of the techniques are demonstrated with a memory management unit.
Keywords :
formal verification; digital systems; formal methods; formal verification; functional verification; inverse property checking; memory management unit; property analysis; quality-driven bounded model checking flow; random testing; Computer science; Design automation; Design engineering; Digital systems; Formal verification; Memory management; Microprocessors; Process design; System testing; Writing; bounded model checking; design understanding; formal verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification, 2008. MTV '08. Ninth International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Print_ISBN :
978-1-4244-3682-8
Type :
conf
DOI :
10.1109/MTV.2008.17
Filename :
5070940
Link To Document :
بازگشت