• DocumentCode
    2002668
  • Title

    Temperature dependence of dielectric relaxation and conductivity of water

  • Author

    Roberts, J.A. ; Huang, J. ; Wang, H.

  • Author_Institution
    Dept. of Phys., Univ. of North Texas, Denton, TX, USA
  • fYear
    1993
  • fDate
    19-23 Jul 1993
  • Firstpage
    150
  • Lastpage
    155
  • Abstract
    The dielectric response of water acting as a load in a resonating microwave cavity was monitored to test for conditions for dielectric breakdown. Macroscopic changes of frequency and width of the resonance were used to monitor the dielectric response of water over the range 273 ⩽ T ⩽ 373 K to test for any structural changes which may lead to dielectric breakdown. Perturbation equations as developed by J. van Bladel, J. C. Slater, and others relate the macroscopic-parameter frequency shift and change in cavity resonance width to the microscopic properties ε" and ε", respectively
  • Keywords
    water; 273 to 373 K; H2O; cavity resonance width; conductivity; dielectric breakdown; dielectric relaxation; macroscopic-parameter frequency shift; perturbation equations; resonating microwave cavity; structural changes; water; Condition monitoring; Conductivity; Dielectric breakdown; Dielectric materials; Frequency; Liquid crystals; Resonance; Temperature dependence; Testing; Water;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
  • Conference_Location
    Baden-Dattwil
  • Print_ISBN
    0-7803-0791-7
  • Type

    conf

  • DOI
    10.1109/ICDL.1993.593931
  • Filename
    593931