DocumentCode
2002668
Title
Temperature dependence of dielectric relaxation and conductivity of water
Author
Roberts, J.A. ; Huang, J. ; Wang, H.
Author_Institution
Dept. of Phys., Univ. of North Texas, Denton, TX, USA
fYear
1993
fDate
19-23 Jul 1993
Firstpage
150
Lastpage
155
Abstract
The dielectric response of water acting as a load in a resonating microwave cavity was monitored to test for conditions for dielectric breakdown. Macroscopic changes of frequency and width of the resonance were used to monitor the dielectric response of water over the range 273 ⩽ T ⩽ 373 K to test for any structural changes which may lead to dielectric breakdown. Perturbation equations as developed by J. van Bladel, J. C. Slater, and others relate the macroscopic-parameter frequency shift and change in cavity resonance width to the microscopic properties ε" and ε", respectively
Keywords
water; 273 to 373 K; H2O; cavity resonance width; conductivity; dielectric breakdown; dielectric relaxation; macroscopic-parameter frequency shift; perturbation equations; resonating microwave cavity; structural changes; water; Condition monitoring; Conductivity; Dielectric breakdown; Dielectric materials; Frequency; Liquid crystals; Resonance; Temperature dependence; Testing; Water;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location
Baden-Dattwil
Print_ISBN
0-7803-0791-7
Type
conf
DOI
10.1109/ICDL.1993.593931
Filename
593931
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