DocumentCode :
2002668
Title :
Temperature dependence of dielectric relaxation and conductivity of water
Author :
Roberts, J.A. ; Huang, J. ; Wang, H.
Author_Institution :
Dept. of Phys., Univ. of North Texas, Denton, TX, USA
fYear :
1993
fDate :
19-23 Jul 1993
Firstpage :
150
Lastpage :
155
Abstract :
The dielectric response of water acting as a load in a resonating microwave cavity was monitored to test for conditions for dielectric breakdown. Macroscopic changes of frequency and width of the resonance were used to monitor the dielectric response of water over the range 273 ⩽ T ⩽ 373 K to test for any structural changes which may lead to dielectric breakdown. Perturbation equations as developed by J. van Bladel, J. C. Slater, and others relate the macroscopic-parameter frequency shift and change in cavity resonance width to the microscopic properties ε" and ε", respectively
Keywords :
water; 273 to 373 K; H2O; cavity resonance width; conductivity; dielectric breakdown; dielectric relaxation; macroscopic-parameter frequency shift; perturbation equations; resonating microwave cavity; structural changes; water; Condition monitoring; Conductivity; Dielectric breakdown; Dielectric materials; Frequency; Liquid crystals; Resonance; Temperature dependence; Testing; Water;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location :
Baden-Dattwil
Print_ISBN :
0-7803-0791-7
Type :
conf
DOI :
10.1109/ICDL.1993.593931
Filename :
593931
Link To Document :
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