Title :
A modular embedded DRAM core concept in 0.24 μm technology
Author :
Schonemann, Konrad
Author_Institution :
Semicond. Group, Siemens AG, Munich, Germany
Abstract :
The development of embedded DRAMs is an important step ahead due to the processor-memory performance gap and the need for new memory architectures with high data bandwidths. In this paper, the motivation for the development of embedded DRAMs is shown, followed by an introduction to advantages, disadvantages, applications and market shares of embedded systems. The main part of the paper is a description of the Siemens Modular Embedded DRAM Core Concept, that allows a customer a large number of degrees of freedom in customizing his special embedded DRAM application
Keywords :
DRAM chips; application specific integrated circuits; embedded systems; integrated circuit design; memory architecture; 0.24 micron; Siemens; customization; data bandwidths; memory architectures; modular embedded DRAM core; Application software; Automatic testing; Electronic equipment testing; Europe; Logic devices; Logic testing; Packaging; Random access memory; Read only memory; Software testing;
Conference_Titel :
Memory Technology, Design and Testing, 1998. Proceedings. International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-8494-1
DOI :
10.1109/MTDT.1998.705941
