Title :
Fabrication and piezoelectricity of fluoropolymer films with patterned structure
Author :
Zhang, Xiaoqing ; Cao, Gongxun ; Sun, Zhuanlan ; Xia, Zhongfu ; Zeng, Changchun ; Zhang, Chuck ; Wang, Ben
Author_Institution :
Dept. of Phys., Tongji Univ., Shanghai, China
Abstract :
Laminated fluoroethylenepropylene (FEP) and porous polytetrafluoroethylene (PTFE) films with patterned void structure were successfully fabricated. An improved model taking into account of both the mechanical structure and charge distribution was used to describe the behavior of the fabricated films. The Young´s modulus of the three-layer FEP/PTFE film is ~0.5 MPa. Maximum quasi-static piezoelectric d33 coefficient up to 500 pC/N is achieved. Compared to the PP piezoelectrets, which loose their piezoelectric activity completely at the annealing temperature of 150°C within 60 min, the laminated FEP/PTFE films show significantly improved thermal stability. For example, the d33-coefficient retains ~22% of the initial value for samples annealed at 150°C for 4500 min.
Keywords :
Young´s modulus; annealing; piezoelectric materials; polymer films; porous materials; thin films; Young´s modulus; annealing; charge distribution; fluoropolymer films; laminated fluoroethylenepropylene films; mechanical structure; patterned void structure; piezoelectrets; piezoelectric coefficient; piezoelectricity; porous polytetrafluoroethylene Alms; temperature 150 degC; thermal stability; time 60 min; Annealing; Dielectrics; Electrets; Films; Force; Thermal stability; patterned structure; piezoelectret; piezoelectricity; template;
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
DOI :
10.1109/ICSD.2010.5568037
