Fluctuation model of liquid dielectrics breakdown with incomplete charge relaxation

A fluctuation model of liquid dielectric breakdown which describes the breakdown from the anode through the ionization mechanism is discussed. In the first approximation, a cellular automation with an anisotropic structure factor is used instead of electric-field calculation. The reason for this approximation is the weak charge relaxation along the conducting branches. Thus, the field increase at conducting tips is not significant. This simple model make it possible to explain basic statistical effects observed in experiments. Furthermore, a more exact model is considered, which takes into account the charge relaxation. This makes it possible to simulate some additional effects. The physical nature of the main growth condition in the fluctuation model is discussed