Title :
A cryogenic mixed-signal process for radiation-hardened applications
Author :
Van vonno, Nicolaas W.
Author_Institution :
Harris Semiconductor, Melbourne, FL, USA
Abstract :
Signal processing and A/D conversion for cryogenic applications places severe demands on the silicon fabrication process used to implement these functions, particularly in ionizing radiation environments. We describe a process designed for cryo applications such as high-energy collider front-end electronics, with specific optimization in the areas of noise, radiation hardness and predictable operation at 77 K. Applications of the technology are reviewed together with device issues and radiation test results
Keywords :
cryogenics; integrated circuit technology; integrated circuit testing; mixed analogue-digital integrated circuits; nuclear electronics; radiation hardening (electronics); 77 K; A/D conversion; Si; cryogenic mixed-signal process; high-energy collider front-end electronics; ionizing radiation environments; radiation hardness; radiation test results; radiation-hardened applications; signal processing; silicon fabrication process; CMOS process; CMOS technology; Circuit testing; Cryogenics; Detectors; Fabrication; Process design; Signal processing; Temperature; Working environment noise;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
Conference_Location :
St. Malo
Print_ISBN :
0-7803-1793-9
DOI :
10.1109/RADECS.1993.316529
