Evaluation of fast neutron irradiation effects at liquid argon temperature

Author

Merkel, B.

Author_Institution

Lab. de l´´Accelerateur Lineaire, Univ. de Paris-Sud, Orsay, France

fYear

1993

fDate

13-16 Sep 1993

Firstpage

318

Lastpage

319

Abstract

Fast neutron irradiation has been performed at liquid argon temperature as a realistic evaluation test for experiments at the LHC Collider at CERN. Early results presented in this note have been obtained with fast charge preamplifiers using Si Jfet and GaAs Mesfet for white noise and 1/f noise increase with neutron fluence. We have observed a degradation of the transconductance in the case of Si Jfet, but a smaller effect on GaAs Mesfet. Optical devices were also studied for light emission with unsatisfactory results, and optical fibres for light transmission showing a remarkable stability

Keywords

Schottky gate field effect transistors; detector circuits; junction gate field effect transistors; low-temperature techniques; neutron effects; nuclear electronics; optical fibres; preamplifiers; random noise; semiconductor device noise; semiconductor device testing; white noise; 1/f noise; CERN; GaAs; GaAs Mesfet; LHC Collider; Si; Si Jfet; evaluation test; fast charge preamplifiers; fast neutron irradiation effects; light emission; light transmission; liquid argon temperature; neutron fluence; optical fibres; transconductance; white noise; Argon; Gallium arsenide; Large Hadron Collider; MESFETs; Neutrons; Performance evaluation; Preamplifiers; Temperature; Testing; White noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on

Conference_Location

St. Malo

Print_ISBN

0-7803-1793-9

Type

conf

DOI

10.1109/RADECS.1993.316530

Filename

316530