DocumentCode
2003550
Title
Comparison of proton and gamma irradiation on HCMOS IC´s
Author
Pesce, A. ; Muschitiello, M. ; Sasanelli, N. ; Paccagnella, A. ; Fuochi, P.G.
Author_Institution
Microelectron. Lab., Tecnopolis CSATA, Bari, Italy
fYear
1993
fDate
13-16 Sep 1993
Firstpage
313
Lastpage
317
Abstract
The sensitivity to gamma rays and protons of HCMOS IC´s coming from two different manufacturers has been evaluated by analyzing total dose effects on the device electrical characteristics at room temperature
Keywords
CMOS integrated circuits; gamma-ray effects; integrated circuit testing; integrated logic circuits; proton effects; HCMOS ICs; device electrical characteristics; gamma irradiation; proton irradiation; radiation sensitivity; room temperature; total dose effects; Annealing; CMOS integrated circuits; Current supplies; Electric variables; Logic devices; Manufacturing; Protons; Space technology; Testing; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
Conference_Location
St. Malo
Print_ISBN
0-7803-1793-9
Type
conf
DOI
10.1109/RADECS.1993.316531
Filename
316531
Link To Document