DocumentCode :
2003623
Title :
Exact and Closed-Form Error Performance Analysis for Hard MMSE Detection in MIMO Systems
Author :
Liu, Peng ; Kim, Il-Min
Author_Institution :
ECE, Queen´´s Univ., Kingston, ON, Canada
fYear :
2010
fDate :
6-10 Dec. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Abstract-We investigate the exact error performance of hard minimum mean-squared error (MMSE) detection in multipleinput multiple-output (MIMO) systems. To facilitate the analysis, we first conduct error analysis for a general system with decision statistic, z = ax + u, where a >; 0, x is the transmitted signal, and u is the arbitrarily distributed noise component which is independent of x. For this general system, we derive the exact and closed-form bit-error rate (BER) expressions for M-ary pulse amplitude modulation (PAM) and quadrature amplitude modulation (QAM) signalings, which include the well-known BER result in [12] as a special case. For the first time in the literature (to the best of our knowledge), we then derive the exact and closed-form instantaneous BER and symbol-error rate (SER) expressions for hard MMSE detection. Finally, the validity of the derived error probability expressions is verified through our own Monte Carlo simulations and the simulation results reported in the literature.
Keywords :
MIMO communication; Monte Carlo methods; error statistics; least mean squares methods; pulse amplitude modulation; quadrature amplitude modulation; signal detection; BER; M-ary pulse amplitude modulation; MIMO system; Monte Carlo simulation; PAM; QAM; SER; closed-form bit-error rate; closed-form error performance analysis; distributed noise component; error probability; hard MMSE detection; minimum mean-squared error detection; multiple-input multiple-output system; quadrature amplitude modulation; symbol-error rate; Binary phase shift keying; Bit error rate; Function approximation; MIMO; Noise; Quadrature amplitude modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Global Telecommunications Conference (GLOBECOM 2010), 2010 IEEE
Conference_Location :
Miami, FL
ISSN :
1930-529X
Print_ISBN :
978-1-4244-5636-9
Electronic_ISBN :
1930-529X
Type :
conf
DOI :
10.1109/GLOCOM.2010.5684206
Filename :
5684206
Link To Document :
بازگشت