Title :
Converting March tests for bit-oriented memories into tests for word-oriented memories
Author :
van de Goor, A.J. ; Tlili, I.B.S. ; Hamdioui, S.
Author_Institution :
Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
Abstract :
In this paper a set of fault models for coupling faults between the cells of a word has been established, together with tests for these fault models. Thereafter, a systematic way of converting tests for bit-oriented memories into tests for word-oriented memories is presented, distinguishing between inter-word and intra-word faults. This results in more efficient tests with complete coverage of the targeted faults. Because most memories have an external data path which is wider than one bit, word-oriented memory tests are very important
Keywords :
fault diagnosis; integrated circuit testing; integrated memory circuits; March tests conversion; bit-oriented memories; fault models; inter-word faults; intra-word faults; word-oriented memories; Bills of materials; Computer architecture; Decoding; Fault detection; Information technology; Logic arrays; Satellite broadcasting; System testing;
Conference_Titel :
Memory Technology, Design and Testing, 1998. Proceedings. International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-8494-1
DOI :
10.1109/MTDT.1998.705945
