DocumentCode
2003702
Title
Prebreakdown strength of atomic liquids with non-attachment molecular additions
Author
Atrazhev, V.M.
Author_Institution
Inst. for High Temperatures, Moscow, Russia
fYear
1993
fDate
19-23 Jul 1993
Firstpage
219
Lastpage
223
Abstract
Theoretical research on the effect of molecular impurities on the development of ionization electron avalanche and on the electrical strength of atomic liquids (liquid Ar, Kr and Xe) is presented. The decrease of prebreakdown voltage is predicted. The results of calculations can be used for design of an experiment
Keywords
argon; Ar; Kr; Xe; atomic liquids; electrical strength; ionization electron avalanche; molecular impurities; prebreakdown voltage; Distribution functions; Electron mobility; Energy loss; Equations; Frequency; Gases; Impact ionization; Impurities; Liquids; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location
Baden-Dattwil
Print_ISBN
0-7803-0791-7
Type
conf
DOI
10.1109/ICDL.1993.593942
Filename
593942
Link To Document