DocumentCode :
2003702
Title :
Prebreakdown strength of atomic liquids with non-attachment molecular additions
Author :
Atrazhev, V.M.
Author_Institution :
Inst. for High Temperatures, Moscow, Russia
fYear :
1993
fDate :
19-23 Jul 1993
Firstpage :
219
Lastpage :
223
Abstract :
Theoretical research on the effect of molecular impurities on the development of ionization electron avalanche and on the electrical strength of atomic liquids (liquid Ar, Kr and Xe) is presented. The decrease of prebreakdown voltage is predicted. The results of calculations can be used for design of an experiment
Keywords :
argon; Ar; Kr; Xe; atomic liquids; electrical strength; ionization electron avalanche; molecular impurities; prebreakdown voltage; Distribution functions; Electron mobility; Energy loss; Equations; Frequency; Gases; Impact ionization; Impurities; Liquids; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location :
Baden-Dattwil
Print_ISBN :
0-7803-0791-7
Type :
conf
DOI :
10.1109/ICDL.1993.593942
Filename :
593942
Link To Document :
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