Title :
Dielectric spectroscopy study of thermally-aged extruded model power cables
Author :
Liu, Tong ; Fothergill, John ; Dodd, Steve ; Dissado, Len ; Nilsson, Ulf H. ; Fu, Mingli ; Perrot, Fabrice
Author_Institution :
Dept. of Eng., Univ. of Leicester, Leicester, UK
Abstract :
“Model” extruded power cables, having a much reduced geometry but using the same extrusion techniques and materials as full-sized cables, have been examined using dielectric spectroscopy techniques to study their thermal ageing effects. Cables insulated with homo-polymer XLPE and co-polymer of XLPE with micron-sized ethylene-butyl-acrylate (EBA) islands were studied by both frequency-domain and time-domain dielectric spectroscopy techniques after accelerated thermal ageing under 135°C for 60 days. In the frequency domain, a frequency response analyzer (FRA) was used to measure the frequency range from 10-4Hz to 1Hz at temperatures from 20°C to 80°C. In the time domain, a special charging/discharging current measurement system was developed to measure the frequencies from 10-1Hz to 102Hz. These techniques were chosen to cope with the extremely low dielectric losses of the model cables. The results are compared with those from new model power cables that were degassed at 80°C for 5 days. Thermal ageing was found to increase the low-frequency conductivity, permittivity and the discharging current. Both homo- and co-polymer cables have substantial increase of dielectric loss after ageing.
Keywords :
XLPE insulation; electric current measurement; frequency-domain analysis; polymer blends; power cables; time-domain analysis; XLPE copolymer; charging-discharging current measurement system; frequency 0.0010 Hz to 1 Hz; frequency response analyzer; frequency-domain dielectric spectroscopy techniques; full-sized cables; homopolymer XLPE; low-frequency conductivity; micron-sized ethylene-butyl-acrylate islands; permittivity; temperature 135 degC; temperature 20 degC to 80 degC; thermally-aged extruded model power cables; time 5 day; time-domain dielectric spectroscopy techniques; Aging; Dielectric loss measurement; Dielectrics; Frequency measurement; Insulation; Loss measurement; Temperature measurement; XLPE; dielectric spectroscopy; model power cables; thermal ageing;
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
DOI :
10.1109/ICSD.2010.5568077