• DocumentCode
    2003926
  • Title

    Polyamideimide-alumina nanocomposites for high-temperatures

  • Author

    Calebrese, Christopher ; Nelson, J. Keith ; Schadler, Linda S. ; Schweickart, Daniel

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Metal oxide nanoparticles have been shown to improve the dielectric breakdown strength of insulating polymers. Polyamideimide is a material of practical use for high temperature insulation, and nanoparticle fillers show promise in improving the high temperature stability and dielectric breakdown strength. This work demonstrates the effect of 40-50 nm alumina nanoparticles on the improvement in AC breakdown strength of polyamideimide at elevated temperature and characterizes related electrical properties to gain insight into the mechanisms leading to this improvement. Breakdown tests were performed at temperatures up to 300°C. The buildup and movement of space charge as a function of filler loading was measured at room temperature using pulsed electroacoustic analysis. Dielectric spectroscopy was used to measure the permittivity at temperatures up to 300°C. In addition to improving the dielectric breakdown strength, alumina nanoparticles also improved the resistance to thermal degradation, which should allow operation of the composites at temperatures above the operating temperature of the base resin.
  • Keywords
    electric breakdown; nanocomposites; pulsed electroacoustic methods; breakdown test; dielectric breakdown strength; dielectric spectroscopy; insulating polymer; metal oxide nanoparticle; nanoparticle filler; polyamideimide-alumina nanocomposites; thermal degradation; Dielectrics; Electric breakdown; Nanocomposites; Nanoparticles; Permittivity; Temperature; Temperature measurement; Dielectric spectroscopy; dielectric strength; high temperature; nanocomposite; polyamidie-imide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5568086
  • Filename
    5568086