Title :
A 252Cf time-of-flight system for SEU testing
Author :
Reier, Melvin ; Swift, Gary
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
A time-of-flight (TOF) system using one micron phosphors optically coupled to RCA8850 photomultiplier (PM) tubes has been developed and demonstrated. Excellent separation between light and heavy fission fragments has been obtained. SEU events are correlated with the specific fragment causing the upset
Keywords :
californium; integrated circuit testing; ion beam effects; photomultipliers; time of flight mass spectroscopy; Cf; IC radiation effects; LET; SEU testing; fission fragments; heavy ions; light ions; photomultiplier tubes; single event upset; time-of-flight system; Detectors; Electron tubes; Laboratories; Optical coupling; Phosphors; Photomultipliers; Propulsion; Signal to noise ratio; Single event upset; System testing;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
Conference_Location :
St. Malo
Print_ISBN :
0-7803-1793-9
DOI :
10.1109/RADECS.1993.316548
