Title :
SEU tests with an improved Cf-252 system
Author :
Chen, R. ; Howard, J.W. ; Block, R.C.
Author_Institution :
Dept. of Nucl. Eng. & Eng. Phys., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
An improved Cf-252 single event upset (SEU) testing system is described. The improved system has a greater range of linear energy transfer (LETs) and has a rotating platform that can test devices at different angles with respect to the beam of fission fragments. The quality of the fission fragment detector is also improved. Better SEU results of a 2k×8 SRAM have been obtained and confirmed those obtained with an accelerator
Keywords :
SRAM chips; fission products; integrated circuit testing; particle detectors; scintillation counters; Cf; Cf-252 SEU testing system; Cf-252 system; SEU tests; fission fragment beams; fission fragment detector; linear energy transfer; rotating platform; single event upset; Detectors; Energy exchange; Iris; Optical attenuators; Physics; Powders; Random access memory; Single event upset; System testing; Wheels;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
Conference_Location :
St. Malo
Print_ISBN :
0-7803-1793-9
DOI :
10.1109/RADECS.1993.316549
