DocumentCode
2003966
Title
SEU tests with an improved Cf-252 system
Author
Chen, R. ; Howard, J.W. ; Block, R.C.
Author_Institution
Dept. of Nucl. Eng. & Eng. Phys., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
1993
fDate
13-16 Sep 1993
Firstpage
88
Lastpage
92
Abstract
An improved Cf-252 single event upset (SEU) testing system is described. The improved system has a greater range of linear energy transfer (LETs) and has a rotating platform that can test devices at different angles with respect to the beam of fission fragments. The quality of the fission fragment detector is also improved. Better SEU results of a 2k×8 SRAM have been obtained and confirmed those obtained with an accelerator
Keywords
SRAM chips; fission products; integrated circuit testing; particle detectors; scintillation counters; Cf; Cf-252 SEU testing system; Cf-252 system; SEU tests; fission fragment beams; fission fragment detector; linear energy transfer; rotating platform; single event upset; Detectors; Energy exchange; Iris; Optical attenuators; Physics; Powders; Random access memory; Single event upset; System testing; Wheels;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
Conference_Location
St. Malo
Print_ISBN
0-7803-1793-9
Type
conf
DOI
10.1109/RADECS.1993.316549
Filename
316549
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